Semiconductor Failure Analysis Using Thermal Imaging

By MoviTHERM

Semiconductor Failure Analysis Using Infrared NDT

Solar Cell Lock In Electroluminescence NDT Solutions

MoviTHERM’s Semi-CHECK solutions allows the detection of shorts and other defects in semiconductors. This system uses a FLIR Thermal camera with microscopic lens attachment in order to provide the correct magnification. Lockin Thermography allows to detect defects with nano-watt to micro-watt signatures.

More info about MoviTHERM Semi-Check

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For Infrared NDT Systems

Infrared Non-destructive Testing Guide

  • Learn how Infrared NDT works

  • Learn what type of defects you can find

  • Learn how large of an area you can inspect

  • Learn how this method compliments UT inspections

  • Learn how to save valuable inspection time

About MoviTHERM

MoviTHERM – Advanced Thermography Solutions was founded in 1999. The company offers solutions for plastic welding, package sealing, and non-destructive testing. In addition, MoviTHERM provides IoT Cloud monitoring solutions for thermal imaging applications for early fire detection, machine condition monitoring, and other applications. MoviTHERM is a Teledyne FLIR Premium Partner and master distributor for FLIR Thermal Cameras for automation and science applications.

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