Semi-Check

irNDT Solution for Semiconductor Failure Analysis

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Semi-Check Functionality

MoviTHERM Semi-Check is a turnkey infrared non-destructive testing (irNDT) Lock-in system developed for microelectronics failure analysis. The system incorporates a 2-quadrant power supply that allows for separate current and voltage modulation using square, sinusoidal, and arbitrary waveforms.

The system works with cooled and uncooled IR cameras with multiple lens configurations to meet various application requirements. The combination of Lock-in Thermography makes it possible to detect thermal variations in the micro-Kelvin range. A special Lock-in online mode allows for virtually unlimited measurement periods for extremely low signals

MoviTHERM Semiconductor Failure Analysis using Lockin Thermography

Turn-Key Solution for Semi-Conductor Testing

Semi-Conductor Failure Analysis
Lock-in Thermography
Functional Circuit Analysis (Power Dissipation, Shorts, etc.)
Forensic Research

Semi-Check Brochure

Semi-Check Benefits

NON-CONTACT FAILURE ANALYSIS

Active irNDT thermography “sees” common microelectronic defects.

FLEXIBLE AND EXPANABLE

Upgrade a system by adding lenses, enclosures, stages, and IR cameras.

irNDT Made Easy

Complex analysis technology is simplified for dependable inspection results.

Semi-Check Functionality

The MoviTHERM Semi-Check system is an affordable Lock-in Thermography system with built in 2-quadrant power supply. The power supply allows for separate current and voltage modulation using square wave, sinusoidal and arbitrary waveforms. The combination of Lock-in Thermography with a high-end cooled thermal camera makes it possible to detect thermal variations in the micro Kelvin range.

A special Lock-in online mode allows for virtually indefinite measurement periods for extremely low signals.

Semi-Check – Technical Specifications

Uncooled Infrared Camera Options		Cooled Infrared Camera Options
Available Resolutions	336 x 256 or 640 x 512	Available Resolutions	640 x 512 or 1280 x 1024
Image Rate	30 Hz / 60 Hz	Image Rate	60 Hz / 120 Hz / 181 Hz / 1000 Hz
Thermal Sensitivity	< 30 mK @ 30°C	Thermal Sensitivity	< 20 mK @ 30°C
PC
PC Type		Office PC, Industry PC, Laptop (for mobile use)
Supported Operating Systems		Windows 10 Pro 64-bit
Excitation Source
Electrical Excitation		0 – 10V input, 0-70V output Programable Power Supply
IRX-Box
Modulation Box for Synchronization of all Hardware and Software Components
Enables Easy and Compact Measuring Setups
irNDT-Software
Evaluation Modules for Lock-in, Lock-in Online, Lock-in Ref., Lock-in Ref. Online
Graphical User Interface for easy creation of customized solutions without programming skills
Integrated MS Excel Report Generator for easy set-up of inspection reports, export of inspection data to Matlab, sorting of inspection parameters in workspaces, and storing of result images include measuring parameters
Integrated VB Script-Engine for the creation of macros for solving automated inspection tasks
Result Viewer App – Allows for calibrated spatial defect measurements
Measuring and Analysis Properties
Parameters for the Excitation Source		Analysis Functions: Pulse, Sine, Trapezoid, Rectangle, User-Defined Function Rectangle Width at Rectangle Modulation: 0.1 – 0.9% Excitation Frequency: 1µHz – 50kHz
Parameters for the IR Camera		Recording Frequency, Integration Time, Temperature Range, Average Temperature, Detector Window, etc.
Parameters for the Analysis		Special Functions for Inspection of Photovoltaic Cells Automatic Noise Reduction Functions and Compensation of exterior interferences in all analysis modules