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So far MoviTHERM has created 157 blog entries.

How to set up an inspection region on a FLIR A310 camera

Set up an Inspection Region on a FLIR A310 Camera This video shows you how to set up an Inspection Region on your FLIR A310 camera. The MoviTHERM MIO Series - Intelligent I/O Module for FLIR® Cameras - supporting one of the following Camera models: FLIR AX8, FLIR FC Series R or FLIR A310 Remote [...]

How to connect a FLIR FC-Series R camera to the MoviTHERM MIO

Connecting a FLIR FC-Series R Camera to the MoviTHERM MIO In this video, we show how to configure the MoviTHERM MIO-FCR-1 and the FLIR FC-Series R thermal camera. Topics include setting ROIs, connecting the camera and MoviTHERM MIO-FCR-1, and how to assign alarms to the analog and digital outputs in the MoviTHERM MIO module. The [...]

How to grab an image from a FLIR A35 A65 using LabVIEW

Grab an Image from a FLIR A35 A65 Using LabVIEW How to grab an image and display the absolute temperature from the thermal camera FLIR A35 A65 using LabVIEW from National Instruments. The following instructions are intended to provide some beginner level advice and it is a “Hello World” example and a first step in [...]

How to grab an image from a FLIR A315 using LabVIEW

Grab an Image from a FLIR A315 Using Labview How to grab an image and display the absolute temperature from the thermal camera FLIR A315 using LabVIEW from National Instruments. The following instructions are intended to provide some beginner level advice and it is a “Hello World” example and a first step in how to [...]

How to grab an image from a FLIR A615 using LabVIEW

Grab an Image from a FLIR A615 Using LabVIEW How to grab an image and display the absolute temperature from the thermal camera FLIR A615 using LabVIEW from National Instruments. The following instructions are intended to provide some beginner level advice and it is a “Hello World” example and a first step in how to [...]

Semiconductor Failure Analysis Using Thermal Imaging

Semiconductor Failure Analysis Using Infrared NDT Solar Cell Lock In Electroluminescence NDT Solutions MoviTHERM’s Semi-CHECK solutions allows the detection of shorts and other defects in semiconductors. This system uses a FLIR Thermal camera with microscopic lens attachment in order to provide the correct magnification. Lockin Thermography allows to detect defects with nano-watt to micro-watt signatures. More [...]

Solar Cell Lockin Electroluminescence

Solar Cell Lockin Electroluminescence Using Infrared NDT Solar Cell Lock In Electroluminescence NDT Solutions MoviTHERM’s Solar-CHECK solution allows for inspection of solar cells. This particular method examines the electroluminescense when using electrical excitation of the cell. More info about MoviTHERM Solar-Check Download Our Starter Guide For Infrared NDT Systems [...]

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