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  • The FLIR A6260 SWIR camera offers superior sensitivity and dynamic range paired with the flexibility of customized windowing and integration times. This InGaAs camera is very linear in the 0.9 to 1.7 µm sensing waveband, making it the perfect tool for high temperature thermal measurements and applications that require measuring through standard glass. The A6260 offers control over settings such as integration time, while allowing you to synchronize and trigger to external events and devices.
  • FLIR A50/A70 Research & Development Kits

    Price range: $7,600.00 through $9,800.00
    FLIR A50 A70 Research & Development Kits are affordable, ready-to-use solutions for thermal imaging analysis in proof-of-concept electronics testing and R&D applications.
    Availability 2 to 3 Weeks
    Select options This product has multiple variants. The options may be chosen on the product page Details
  • FLIR A400 Science Kits

    Price range: $9,050.00 through $11,650.00
    FLIR A400 Science Kits offer researchers and engineers a streamlined solution for accurate temperature measurement.
    Availability 2 to 3 Weeks
    Select options This product has multiple variants. The options may be chosen on the product page Details
  • FLIR A500 Science Kits

    Price range: $11,700.00 through $14,300.00
    FLIR A500 Science Kits offer researchers and engineers a streamlined solution for accurate temperature measurement.
    Availability 2 to 3 Weeks
    Select options This product has multiple variants. The options may be chosen on the product page Details
  • FLIR A700 Science Kits

    Price range: $14,500.00 through $17,150.00
    FLIR A700 Science Kits offer researchers and engineers a streamlined solution for accurate temperature measurement.
    Availability 2 to 3 Weeks
    Select options This product has multiple variants. The options may be chosen on the product page Details
  • MoviTHERM’s FLIR A6780 SLS LWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6780 MWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6700 MWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6750 SLS LWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6750 MWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A8580 SLS LWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A8580 MWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
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