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  • MoviTHERM’s FLIR X6980 MWIR non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR X6980 SLS LWIR non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR X6800sc MWIR non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A8580 MWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A8580 SLS LWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6750 MWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6750 SLS LWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6700 MWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6780 MWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • MoviTHERM’s FLIR A6780 SLS LWIR Camera non‐destructive testing systems use active thermography for the reliable detection of delaminations, impact damages, “near side” defects, water inclusions, debondings, and other defects. The system achieves precise measurements and is ideal for inspecting composites, metals, semiconductors, microelectronics, batteries, ceramics, and more. Our irNDT system accommodates a wide range of irNDT measurement methods, including: Flash‐Thermography, Lock‐In Thermography, Transient Thermography, and Vibro‐Thermography. It also works with multiple excitation sources and with cooled or uncooled infrared camera systems.
  • FLIR A700 Science Kits

    Price range: $14,500.00 through $17,150.00
    FLIR A700 Science Kits offer researchers and engineers a streamlined solution for accurate temperature measurement.
    Availability 2 to 3 Weeks
    Select options This product has multiple variants. The options may be chosen on the product page Details
  • FLIR A500 Science Kits

    Price range: $11,700.00 through $14,300.00
    FLIR A500 Science Kits offer researchers and engineers a streamlined solution for accurate temperature measurement.
    Availability 2 to 3 Weeks
    Select options This product has multiple variants. The options may be chosen on the product page Details
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